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Focused Ion Beam Short Course
October 5, 2018 @ 9:00 am - 5:00 pm$50 – $350
The Focused Ion Beam (FIB) short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB, as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB, the course will be limited to 4 participants.
Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.
For more details and to register, please visit the short course website.