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Scanning Electron Microscopy (SEM) Short Course
May 19, 2017 @ 8:00 am - 5:00 pm$50 – $350
NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means. This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.
For more details and to register, please contact Chuck Mooney at email@example.com. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.