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Surface Analysis (XPS and ToF-SIMS) Short Course

September 28, 2018 @ 8:30 am - 4:00 pm

$50 – $350

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

Venue

Monteith Research Center (Room 320), NC State University
2410 Campus Shore Drive
Raleigh, NC United States
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