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X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) Short Course
February 17, 2017 @ 8:30 am - 4:00 pm$50 - $350
NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.
For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email email@example.com. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. Course limited to 6 people.