To submit information for posting on this calendar, use our Event Submission Form.

Loading Events

« All Events

  • This event has passed.

XPS and ToF-SIMS Short Course

September 30, 2016 @ 8:30 am - 4:00 pm

$50 – $350

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hands-on of each instrument following the lecture.

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu. Course limited to 6 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.

Venue

Monteith Research Center (Room 324), NC State University
2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map