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XPS and ToF-SIMS Short Course
April 8, 2016 @ 8:30 am - 4:00 pm
This introductory short course will cover basic principles of surface analysis and the two commonly used techniques X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.
For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email firstname.lastname@example.org.
Course limited to 6 people.