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June 2018
X-ray Diffraction Short Course
NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center,…
Find out more »July 2018
Atomic Force Microscopy Workshop
Discover how AFM can benefit your research. In this series of workshops, the Origin+ AFM at NC State's AIF will be showcased, presenting its scan modes & real-world results. See techniques demonstrated by Asylum Research staff in the afternoon. Topics include: 6/22: AFM for polymer surface characterization 6/22: AM-FM™ viscoelastic imaging 7/27: Cells/soft materials 7/27: Nanomechanics 7/27: In-liquid work 8/17: Nanomagnetics Speakers: Keith Jones, Oxford Instruments Asylum Research Ryan Fuierer, Oxford Instruments Asylum Research Contact Ryan Fuierer (ryan.fuierer@oxinst.com) or Chuck Mooney…
Find out more »August 2018
Atomic Force Microscopy Workshop
Discover how AFM can benefit your research. In this series of workshops, the Origin+ AFM at NC State's AIF will be showcased, presenting its scan modes & real-world results. See techniques demonstrated by Asylum Research staff in the afternoon. Topics include: 6/22: AFM for polymer surface characterization 6/22: AM-FM™ viscoelastic imaging 7/27: Cells/soft materials 7/27: Nanomechanics 7/27: In-liquid work 8/17: Nanomagnetics Speakers: Keith Jones, Oxford Instruments Asylum Research Ryan Fuierer, Oxford Instruments Asylum Research Contact Ryan Fuierer (ryan.fuierer@oxinst.com) or Chuck Mooney…
Find out more »September 2018
X-ray Diffraction Short Course
NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center,…
Find out more »