Atomic Force Microscopy Workshop

Discover how AFM can benefit your research.┬áIn this series of workshops, the Origin+ AFM at NC State’s AIF will be showcased, presenting its scan modes & real-world results. See techniques demonstrated by Asylum Research staff in the afternoon.

Topics include:

  • 6/22: AFM for polymer surface characterization
  • 6/22: AM-FM™ viscoelastic imaging
  • 7/27: Cells/soft materials
  • 7/27: Nanomechanics
  • 7/27: In-liquid work
  • 8/17: Nanomagnetics

Keith Jones, Oxford Instruments Asylum Research
Ryan Fuierer, Oxford Instruments Asylum Research

Contact Ryan Fuierer ( or Chuck Mooney ( with questions or to register.