Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on March 10th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Special Topics in TEM: EELS Workshop

NC State’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The first workshop in the Spring of 2017 is about Electron Energy Loss Spectroscopy (EELS). The following topics will be covered in this workshop:

  1. Fundamentals of EELS
  2. Practical setup of EELS acquisition
  3. EELS spectra processing and analysis
  4. Quantification of EELS
  5. Advanced EELS techniques (brief introduction, a following workshop focus on advanced techniques will be open soon)

To ensure each participant receives a maximum of time, the workshop will be limited to 6 participants. For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

AIF Seeks Applications for Talented Electron Microscopist

The Analytical Instrumentation Facility (AIF) seeks a talented and industrious experimentalist to join our team as an Electron Microscopy Specialist. The AIF is NC State’s primary shared facility for materials characterization with a mission to enable and lead state-of-the-art research through acquisition, development, maintenance, training, and access to major analytical and materials characterization instrumentation. Through the support of engaged faculty and experienced staff, the AIF supports state-of-the-art scanning and transmission electron microscopes, X-ray scattering and spectroscopy instruments, mass spectrometry, scanning probe microscopy, nanoindentation, and extensive sample preparation facilities. The AIF is a core nanotechnology user facility in the new Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).

Primary responsibilities of the new position include training new users (both internal users from NC State and those external to NC State) as well as performing service work for external clients. The ideal candidate will be customer-focused and exhibit a commitment to excellence in all technical and organizational aspects of their role. The new Postdoc will work closely with the AIF and RTNN teams in serving the needs of university, industrial, and government researchers from across NC State, the North Carolina Research Triangle, and the nation.

Please encourage talented applicants to apply:
Full-time staff position: https://jobs.ncsu.edu/postings/76529
Postdoc: https://jobs.ncsu.edu/postings/76522

Transmission Electron Microscopy (TEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.

Cryogenic Scanning Electron Microscopy (CryoSEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Cryogenic Scanning Electron Microscopy (SEM) on a routine basis.  There is a 1.5 hr lecture on CryoSEM theory, application, and sample preparation. Each student will get hands-on time (90 minute or more per student) for preparing CryoSEM samples and running the AIF JEOL JSM-7600 SEM.  The goal of the course is to provide students a basic understanding of both theory and practice.  To ensure each student receives maximum hands-on time, the course will be limited to 4 participants.

For more details and to register, please contact Chuanzhen Zhou at czhou@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.

Scanning Electron Microscopy (SEM) Short Course

This hands-on short course on Scanning Electron Microscopy (SEM) is offered on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time (90 minute or more per student) running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic understanding of both theory and practice such that they can operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.