NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

SMIF’s New Cryo-TEM joins Molecular Microscopy Consortium

Duke’s Shared Materials Instrumentation Facility will soon be home to a new cryo-transmission electron microscope: the FEI Krios. The microscope joins the FEI Talos Arctica (located at the the National Institute of Environmental Health Sciences, NIEHS) as part of the Molecular Microscopy Consortium (MMC) in the Research Triangle. This consortium is a partnership between NIEHS, Duke University, and the University of North Carolina at Chapel Hill. The mission of the MMC is to enable the use of single particle cryo-electron microscopy (cryo-EM) and other tools in molecular microscopy to researchers across North Carolina. Cryo-EM is increasingly being used to determine the structure of macromolecules at atomic resolution. There is also emerging interest in applying the technology to the ultrastructure analysis of cellular compartments. The MMC was established to meet the growing demand for instrumentation and expertise in this area.

Director Mario Borgnia leads the MMC and is supported by a Core Team of expert personnel from each participating institution. The MMC functions as a space where projects are carried out as scientific collaborations with members of the Core Team. The following types of projects are currently being pursued:

  • Structural biology groups with an established cryo-EM expertise seeking access to imaging equipment or processing pipelines
  • Collaborative projects in which the lead is a structural biology group seeking to be trained and gain expertise in cryo-EM
  • Long term collaborative projects with non-structural groups where the MMC provides expertise by solving structures using cryo-EM
  • Collaborative projects in which there is a need for significant development of new techologies in cryo-EM

Researchers interested in using the MMC should contact Mario Borgnia (919-541-3120; mario.borgnia2@nih.gov) for details regarding the application process. The MMC is open to applications from academic institutions in the Triangle and surrounding regions.

Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on March 10th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.