Focused Ion Beam Short Course

The Focused Ion Beam (FIB) short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB, as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB, the course will be limited to 4 participants.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

Focused Ion Beam Short Course

This short course includes lectures covering an introduction to the focused ion beam (FIB) technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on April 27th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on September 29th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on April 28th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.