Workshop: Advanced Applications of Infrared & Raman Spectroscopy

April 24, 2019 @ 9:00 am 1:00 pm

Join us to learn about Infrared and Raman Spectroscopy techniques for materials research in half-day seminar. Lunch included.

 You will learn how to:

  • Optimize FTIR spectrometer settings to get best results
  • Characterize chemical composition of  thin films on metallic and non-metallic substrates
  • Monitor fast chemical reactions, study orientation of polymer chains, identify defects and contamination using IR and Raman microspectroscopy

Examples of applications will include surface chemistry during atomic layer deposition, electrochemistry, multilayer polymer films composition, and reverse engineering.

Register for the event here.

Questions can be directed to Carrie Donley (cdonley@email.unc.edu).

Chapel Hill Analytical and Nanofabrication Laboratory

Venable Hall

Venable Hall, Room G307
Chapel Hill, 27514 United States
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Confocal Raman Spectroscopy Short Course

The Confocal Raman short course includes lectures covering an introduction to the Raman spectrometry and Confocal Raman spectroscopy technique, an overview of the principles and operation of the Raman, as well as applications such as Raman on liquid and solids. Also, there will be hands-on demonstrations of these applications on the Horiba Xplora Confocal Raman. To ensure each student receives a maximum amount of time on the Raman, the course will be limited to 4 participants.

For more details and to register, please visit the short course website.

 

XPS and ToF-SIMS Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hands-on of each instrument following the lecture.

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu. Course limited to 6 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.