NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.
This introductory course will cover the following topics:
- Basic principles of TEM.
- Basic diffraction and imaging.
- Introduction of advanced characterization techniques.
During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.
For more details and to register, please contact Dr. Yang Liu at his email firstname.lastname@example.org. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.