Transmission Electron Microscopy (TEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.

TEM Wedge Preparation Workshop

In association, with the Research Triangle Nanotechnology Network (RTNN) and Allied High Tech Products, the Analytical Instrumentation Facility (AIF) will host this two day workshop. Attendees will get hands on experience with using the Allied MultiprepTM polisher to create electron transparent samples suitable for TEM analysis. Due to the hands on nature of this course the size will be limited to ensure users get adequate time on the instruments. For more details and to register, please contact Roberto Garcia at his email

In Situ Characterization Workshop

Research Triangle Nantotechnology Network (RTNN) and AIF will host an In Situ materials characterization workshop on October 28, 2015 from 8:30 am to 11:30 am at Centennial Campus, Monteith Research Center, 2410 Campus Shore Drive, Room 246.


8:30 am – Welcome to AIF and Research Triangle Nanotechnology Network Dr. Elizabeth Dickey, Center for Dielectrics & Piezoelectrics Director

8:45 am – In-situ TEM, Beth Dicky, North Carolina State University

9:15 am – In-situ X-ray Diffraction for Materials Development and Innovation Chris Fancher, North Carolina State University

9:45 am – Question and Answer Session With the Experts – Coffee, tea and light snacks will be served

10:15 am – Laboratory Breakout Demonstrations
          In-Situ XRD – MRC Rooms 303B and 303C
          Liquid-cell TEM – EB1 1046 Suite
          In-situ heating SEM/FIB – MRC Room 119
          Environmental TEM – MRC Room 122