Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new TEM users with an interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours of theory component and the rest of the day will be in laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM
  2. Basic diffraction and imaging
  3. Introduction of advanced characterization techniques

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

Special Topics in TEM: EFTEM Workshop

NC State’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The second workshop in the Spring of 2017 will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:

  1. Fundamentals of EFTEM
  2. Practical setup of EFTEM acquisition
  3. EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
  4. EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges

To ensure each participant receives a maximum of time, the workshop will be limited to 6 participants. For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Special Topics in TEM: EELS Workshop

NC State’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The first workshop in the Spring of 2017 is about Electron Energy Loss Spectroscopy (EELS). The following topics will be covered in this workshop:

  1. Fundamentals of EELS
  2. Practical setup of EELS acquisition
  3. EELS spectra processing and analysis
  4. Quantification of EELS
  5. Advanced EELS techniques (brief introduction, a following workshop focus on advanced techniques will be open soon)

To ensure each participant receives a maximum of time, the workshop will be limited to 6 participants. For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.