RTNN hosts XRD Symposium

Malvern PANalytical and the RTNN hosted a “Non-ambient X-ray Diffraction (XRD)” workshop at NC State November 8-9. The event brought together 48 attendees from 17 different universities and organizations to explore the research potential of non-ambient diffraction and practical advice for collecting accurate and useful data. On the evening of November 8, attendees learned more about on-going research during a poster session.

The picture shows Dr. Tom Blanton, the executive director of International Centre for Diffraction Data (ICDD), presenting his work on ‘Materials Characterization using the ICDD  PDF-4+’.

X-ray Diffraction Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at here for this information and other requirements to gain future access to the instruments).

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.eduCourse limited to 10 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Example of XRD data

 

New Approach to Determine Atomic Arrangement in Materials

RTNN researchers at NC State University have published an article describing a new way to determine how atoms are arranged in materials. The work, “Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis” published in Scientific Reports describes the application of Bayesian statistical methods to X-ray diffraction patterns. This method allows researchers to characterize and better estimate the variability in a material’s atomic structure. The technique is under development for use with spectra collected from other analytical tools like X-ray photoelectron spectroscopy. This tool-set will inform the development of materials for a variety of novel applications.

A press release describing the work can be found here. The article in its entirety can be found here.

 

X-ray Diffraction (XRD) Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component (taught by Prof. Jacob Jones), 1-hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at here for this information and other requirements to gain future access to the instruments).

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.eduCourse limited to 10 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. RTNN is able to offset costs associated with registration and travel to a limited number of participants who demonstrate need. To apply for support, please visit the RTNN support page.

Example of XRD data

 

XRD Short Course

This introductory course will cover basic principles of X-ray diffraction (XRD), operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component (taught by Assoc. Prof. Jacob Jones), 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at https://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu.

Course limited to 10 people.