Special Topics in TEM: EFTEM Workshop

NC State’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The second workshop in the Spring of 2017 will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:

  1. Fundamentals of EFTEM
  2. Practical setup of EFTEM acquisition
  3. EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
  4. EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges

To ensure each participant receives a maximum of time, the workshop will be limited to 6 participants. For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.