Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on April 28th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.