NC State’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The second workshop in the Spring of 2017 will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:
- Fundamentals of EFTEM
- Practical setup of EFTEM acquisition
- EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
- EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges
To ensure each participant receives a maximum of time, the workshop will be limited to 6 participants. For more details and to register, please contact Dr. Yang Liu at his email firstname.lastname@example.org. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.