Scanning Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on September 29th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Scanning Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

X-ray Diffraction Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at here for this information and other requirements to gain future access to the instruments).

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.eduCourse limited to 10 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Example of XRD data

 

Basic Vacuum Technology Short Course

This is primarily a hands on course with some lecture time. Individuals will work on two functioning vacuum systems. Each attendee will manually remove and install components to learn practical knowledge when dealing with vacuum systems. Covered components include forepumps, turbomolecular pumps, ion pumps, thermocouple and cold cathode gauges, valves, flanges, and feedthroughs.

For more details, please contact Dr. Fred Stevie at his email fastevie@ncsu.edu.

To register, contact Dr. Maude Cuchiara (mlrowlan@ncsu.edu or 919-515-6171).

Basic Vacuum Technology Short Course

This is primarily a hands on course with some lecture time. Individuals will work on two functioning vacuum systems. Each attendee will manually remove and install components to learn practical knowledge when dealing with vacuum systems. Covered components include forepumps, turbomolecular pumps, ion pumps, thermocouple and cold cathode gauges, valves, flanges, and feedthroughs.

For more details, please contact Dr. Fred Stevie at his email fastevie@ncsu.edu.

To register, contact Dr. Maude Cuchiara (mlrowlan@ncsu.edu or 919-515-6171).

Basic Vacuum Technology Short Course

This is primarily a hands on course with some lecture time. Individuals will work on two functioning vacuum systems. Each attendee will manually remove and install components to learn practical knowledge when dealing with vacuum systems. Covered components include forepumps, turbomolecular pumps, ion pumps, thermocouple and cold cathode gauges, valves, flanges, and feedthroughs.

For more details, please contact Dr. Fred Stevie at his email fastevie@ncsu.edu.

To register, contact Dr. Maude Cuchiara (mlrowlan@ncsu.edu or 919-515-6171).

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on April 28th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.