Carolina Science Symposium

The Analytical Instrumentation Facility (AIF) is pleased to continue as host of the Carolina Science Symposium (formerly the Materials Research Society (MRS), ASM International, and American Vacuum Society (AVS) joint symposium. The meeting is expected to draw about 100 participants, both locally and from the surrounding region. Topics in materials science, processing, characterization, and biomaterials will be presented by both invited and selected student contributorsA student poster session will be held, and 3 student contributed papers will be selected for 15 minute oral presentations. When registering, you will be asked to indicate whether the abstract should be considered for a poster or for a talk (eligible for an oral presentation). Over $1000 will be awarded to the best student oral presentation and top 3 poster presentations. The abstract deadline is November 3For more information and to register, please visit the Carolina Science Symposium website.

Scanning Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understanding the morphology, structure, defects, crystal orientation, and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new users of the TEM  with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include a theory component in the morning (9:00 am to 11:00 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic diffraction and imaging.
  3. Introduction of advanced characterization techniques.

During this course, the attendee will obtain theoretical and practical knowledge on how to conduct basic imaging and diffraction using TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

Scanning Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

AIF Cool Science Seminar Series: Dr. Josh Kacher

Come grab a bowl of Howling Cow Ice Cream and join us for the inaugural talk in the AIF Seminar Series. Dr. Josh Kacher, assistant professor in Georgia Tech’s Materials Science and Engineering department, will present advances in localized strain mapping (abstract below). The AIF Seminar Series is designed to be informal, interactive, and fun. There will be plenty of opportunities to discuss science and network.

Please RSVP here by July 28, 2017.

“Diffraction-Based Multimodal Image Acquisition and Strain Mapping in the Electron Microscope”

Advances in electron detector technology, including the advent of direct-electron detectors, and increases in computational processing capacity have transformed electron microscopy-based characterization into a big-data analytics tool capable of multimodal image acquisition and high-resolution property mapping. This includes the ability to post-experiment select desired imaging conditions and map out the three-dimensional elastic strain tensor, crystal rotations, and dislocation density at length scales ranging from nanometers to hundreds of microns. Increases in electron detection efficiency available from direct-electron detectors also allows multimodal image acquisition to be coupled with in situ electron microscopy experiments such as heating, straining, and exposure to aggressive environments. Central to these advances is the development and application of scanning nanobeam diffraction techniques in both scanning and transmission electron microscopy.  This talk will review recent advances in multimodal image acquisition and property mapping with a focus on two materials applications: relating microstructure to strain localization in metal alloys and characterizing strain gradients in compositionally graded ferroelectric thin films.

Want to know more about the Kacher Lab. Visit the lab website.

RTNN Lunch and Learn at UNC-Chapel Hill

Come learn about unique capabilities that could aid in your research! Over lunch, Roberto Garcia (lab manager of NC State’s Analytical Instrumentation Facility, AIF), Dr. John Muth (director of the NC State Nanofabrication Facility, NNF) and Dr. Mark Walters (director of Duke’s Shared Materials Instrumentation Facility, SMIF) will highlight instrumentation at their respective facilities. The RTNN will provide free lunch to all attendees. This talk will take place at UNC: Chapman Hall, Room 125.

Focused Ion Beam Short Course

NC State’s Analytical Instrumentation Facility will offer another Focused Ion Beam (FIB) short course on April 28th. The short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Basic Vacuum Technology Short Course

This is primarily a hands on course with some lecture time. Individuals will work on two functioning vacuum systems. Each attendee will manually remove and install components to learn practical knowledge when dealing with vacuum systems. Covered components include forepumps, turbomolecular pumps, ion pumps, thermocouple and cold cathode gauges, valves, flanges, and feedthroughs.

In addition to hands-on instruction, attendees will receive the following:

  • Digital copy of lecture materials
  • Tour of AIF facility

For more details and to register, please contact Dr. Fred Stevie at his email fastevie@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.