AIF now home to compact microCT system

The Analytical Instrumentation Facility (AIF) is now home to a Bruker SkyScan 1174 microCT system. This compact microCT can be used to image a variety of samples in three-dimensions with down to 10 micron spatial resolution. A suite of software tools is  included with the system for complex image reconstruction, processing, and analysis. Several example images can be found here, and the specs are listed below. The instrument will be available for both research and outreach activities by early October. For more information on training and access, please contact Maude Cuchiara.

X-ray source 20-50kV, 40W maximum power, filter holder for energy selection
X-ray detector 1.3Mp CCD coupled to scintillator by lens with 1:6 zoom range
Spatial Resolution 6…30 µm pixel size, approximately 10 µm low-contract resolution
Object Size 5 – 30mm in diameter, 50mm in length (50mm vertical travel)
Radiation safety <1 µSv/h at 10cm from the instrument surface

 

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Scanning Electron Microscopy (SEM) Short Course

NC State’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants. To ensure each student receives maximum hands-on time, the course will be limited to 3 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Silver nanocubes for multispectral imaging and printing

Researchers at Duke University recently published a paper in Advanced Materials describing the development of a technique to detect light across the electromagnetic spectrum. As opposed to using materials that absorb specific wavelengths of light, silver nanocube structures trap different types of light. This can be controlled by changing the size and arrangement of the nanocubes. To learn more see the Duke press release or read the article.

Toward Multispectral Imaging with Colloidal Metasurface Pixels
Jon W. Stewart, Gleb M. Akselrod, David R. Smith, and Maiken H. Mikkelsen

Abstract: Multispectral colloidal metasurfaces are fabricated that exhibit greater than 85% absorption and ≈100 nm linewidths by patterning film-coupled nanocubes in pixels using a fusion of bottom-up and top-down fabrication techniques over wafer-scale areas. With this technique, the authors realize a multispectral pixel array consisting of six resonances between 580 and 1125 nm and reconstruct an RGB image with 9261 color combinations.