X-ray Diffraction (XRD) Short Course

March 15, 2019 @ 9:00 am 5:00 pm

This introductory XRD short course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people.

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

$50 – $350

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

X-ray Diffraction (XRD) Short Course

January 25, 2019 @ 9:00 am 4:00 pm

This introductory XRD short course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people.

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

$50 – $350

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

Surface Analysis (XPS and ToF-SIMS) Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants. For more details and to register, please visit the short course website.

AIF now home to compact microCT system

The Analytical Instrumentation Facility (AIF) is now home to a Bruker SkyScan 1174 microCT system. This compact microCT can be used to image a variety of samples in three-dimensions with down to 10 micron spatial resolution. A suite of software tools is  included with the system for complex image reconstruction, processing, and analysis. Several example images can be found here, and the specs are listed below. The instrument will be available for both research and outreach activities by early October. For more information on training and access, please contact Maude Cuchiara.
X-ray source 20-50kV, 40W maximum power, filter holder for energy selection
X-ray detector 1.3Mp CCD coupled to scintillator by lens with 1:6 zoom range
Spatial Resolution 6…30 µm pixel size, approximately 10 µm low-contract resolution
Object Size 5 – 30mm in diameter, 50mm in length (50mm vertical travel)
Radiation safety <1 µSv/h at 10cm from the instrument surface
 

Rigaku SmartLab X-ray Diffractometer coming soon to CHANL

CHANL is thrilled to offer powder and thin film x-ray diffraction with a new Rigaku SmartLab X-ray diffractometer (XRD). This system is capable of grazing angle measurements for measuring diffraction from thin films and possesses an in-plane diffraction arm for measuring crystalline planes perpendicular to the sample surface. Samples with periodicity on length scales up to 100 nm can be characterized with the SAXS unit, and micro area measurements with spot sizes as small as 100 μm are also possible.  Rocking curves, pole figures, and reflectivity measurements are all available with this system, which is also equipped with a HyPix-3000 2D detector. A number of sample stages allowing for sample heating and cooling (-100ºC to 1,000ºC) and environmental control (inert atmosphere, vacuum, reactive gas) are available for interesting in situ measurements. The SmartLab Guidance software makes these measurements easy to implement as it guides users to install the correct optical components, and walks them through the appropriate alignments before measurements begin. Powerful analysis software includes access to the ICDD PDF2 database, allows for Rietveld whole pattern fitting, and 2D pattern analysis. If you would like additional information about this tool, please email Carrie Donley (cdonley@email.unc.edu).