X-ray Diffraction (XRD) Short Course

March 15, 2019 @ 9:00 am 5:00 pm

This introductory XRD short course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people.

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

$50 – $350

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

X-ray Diffraction (XRD) Short Course

January 25, 2019 @ 9:00 am 4:00 pm

This introductory XRD short course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people.

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

$50 – $350

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

X-ray Diffraction Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.eduCourse limited to 10 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Example of XRD data

X-ray Diffraction Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include a 1-hour theory component, 1-hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.eduCourse limited to 10 people. Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

Example of XRD data

Rigaku SmartLab X-ray Diffractometer coming soon to CHANL

CHANL is thrilled to offer powder and thin film x-ray diffraction with a new Rigaku SmartLab X-ray diffractometer (XRD). This system is capable of grazing angle measurements for measuring diffraction from thin films and possesses an in-plane diffraction arm for measuring crystalline planes perpendicular to the sample surface. Samples with periodicity on length scales up to 100 nm can be characterized with the SAXS unit, and micro area measurements with spot sizes as small as 100 μm are also possible.  Rocking curves, pole figures, and reflectivity measurements are all available with this system, which is also equipped with a HyPix-3000 2D detector. A number of sample stages allowing for sample heating and cooling (-100ºC to 1,000ºC) and environmental control (inert atmosphere, vacuum, reactive gas) are available for interesting in situ measurements. The SmartLab Guidance software makes these measurements easy to implement as it guides users to install the correct optical components, and walks them through the appropriate alignments before measurements begin. Powerful analysis software includes access to the ICDD PDF2 database, allows for Rietveld whole pattern fitting, and 2D pattern analysis.

If you would like additional information about this tool, please email Carrie Donley (cdonley@email.unc.edu).