AIF Open House and User Appreciation

August 30, 2019 @ 1:30 pm 4:00 pm

Please join the Analytical Instrumentation Facility (AIF) for its annual Open House & User Appreciation. During this time, there will be an introduction for new users (presented by Dr. Chris Winkler), AIF tours for new and existing users, and an ice cream social featuring NC State’s Howling Cow ice cream. Although the event is free, please make sure to RSVP in order to ensure there is plenty of ice cream!

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center, Room 136

2410 Campus Shore Drive
Raleigh, NC 27695 United States
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Focused Ion Beam Short Course

The Focused Ion Beam (FIB) short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB, as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB, the course will be limited to 4 participants.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

Transmission Electron Microscopy Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new TEM users with an interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours of theory component and the rest of the day will be in laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM
  2. Basic diffraction and imaging
  3. Introduction of advanced characterization techniques

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

Surface Analysis (XPS and ToF-SIMS) Short Course

NC State’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.

Scanning Electron Microscopy Short Course

The goal for the day is to learn the basics of scanning electron microscopy (SEM) theory and SEM operation so that you can apply that knowledge to analyzing your own samples and/or understanding what SEM data means. Please note that a short course is designed to teach you how the technique works, the data that can be derived thereof, and what the generated data means. Training is designed to teach you the operational specifics of a particular instrument. Assuming that all is well you should be able to drive the Hitachi S-3200N SEM more or less independently by the end of the day. That said, it is not unusual for users to request additional training for a particular instrument.

We will start with an introduction lecture to SEM after which we will move to the lab. In the first lab, the student will observe a demonstration of SEM operation.  Then each of you will drive the microscope on a standard sample and we will explore changing instrument conditions and the resulting effect on the data. During this phase, we will also learn how to focus and correct astigmatism as well as how to properly set signal gain (contrast) and offset (brightness). After a break for lunch, there will be another lecture where we learn more about electron beam-sample interactions, detectors, how to pick imaging conditions, etc. Then we will go to the lab where you can apply what you have learned by imaging any sample you wish. You are welcome to bring a sample for this time or I can find one that is appropriate.

You should bring something to write with and on, a memory stick for the presentation and any data or other information that is electronic, and last but certainly not least, your brain. You can also bring a sample for hands-on time in the afternoon. We will take a short break for lunch, probably on the order of 30-45 minutes, so it might be smart to bring lunch with you.

This should be a relaxed and enjoyable day where you learn something fun and useful. Questions? Please contact Chuck Mooney at cbmooney@ncsu.edu. To maximize hands-on time, the class is limited to three students.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants.

For more details and to register, please visit the short course website.