In Situ Microscopy Congress

During this exciting two day workshop, you will have the opportunity to learn about in situ and discuss liquid and gaseous experiments with some of the world’s leading researchers. Featuring latest and greatest in situ solutions offered by Protochips and Thermo Fisher Scientific, numerous talks and demonstrations will show you how in situ techniques can accelerate your research, allowing you to discover more and publish faster.

Once registered, authors will have the option of submitting an abstract to be considered for an oral or poster presentation.

For more information and to register, please visit the event website.

Monday, March 2nd

8:30-9:00 Registration and check-in

9:00-9:15 Opening remarks from AIF, Thermo Fisher Scientific, and Protochips

9:15–12:00 Technical Session: In Situ Gas Cell TEM/STEM

-Plenary Speaker: Xiaoqing Pan, University of California, Irvine

-This symposium will showcase new results and applications for environmental TEM techniques, as well as cover new equipment capabilities and in situ techniques related to the field.

12:00-1:00 Lunch – provided

1:00-4:00 Technical Session: In Situ Liquid Cell TEM/STEM

-Plenary Speaker: Haimei Zheng, Lawrence Berkeley National Lab

-This symposium will highlight many aspects of LCTEM, from cutting-edge results and future research directions to new techniques and improved equipment designs.

4:00-5:30 Poster Session and Cocktail Hour

Tuesday, March 3rd

9:30-11:00 Introductory Presentations by Thermo Fisher Scientific and Protochips

11:00-12:15 Coffee Break and Panel Discussion on In Situ TEM/STEM

12:15-1:15 Lunch – provided

1:15-2:45 Hands-on Product Demonstrations:

-Imaging liquid samples using the aberration corrected Titan 80-300 STEM

-Studying catalysts in atmospheric environments with the Talos F200X G2 TEM/STEM

-Capabilities and Applications using Focused Ion Beam (FIB) techniques

2:45-3:15 Coffee Break and Transition

3:15-4:45 Hands-on Product Demonstrations:

-Imaging liquid samples using the aberration corrected Titan 80-300 STEM

-Studying catalysts in atmospheric environments with the Talos F200X G2 TEM/STEM

-Capabilities and Applications using Focused Ion Beam (FIB) techniques

4:45-5:00 Wrap Up & Conclusions

Rigaku SmartLab X-ray Diffractometer coming soon to CHANL

CHANL is thrilled to offer powder and thin film x-ray diffraction with a new Rigaku SmartLab X-ray diffractometer (XRD). This system is capable of grazing angle measurements for measuring diffraction from thin films and possesses an in-plane diffraction arm for measuring crystalline planes perpendicular to the sample surface. Samples with periodicity on length scales up to 100 nm can be characterized with the SAXS unit, and micro area measurements with spot sizes as small as 100 μm are also possible.  Rocking curves, pole figures, and reflectivity measurements are all available with this system, which is also equipped with a HyPix-3000 2D detector. A number of sample stages allowing for sample heating and cooling (-100ºC to 1,000ºC) and environmental control (inert atmosphere, vacuum, reactive gas) are available for interesting in situ measurements. The SmartLab Guidance software makes these measurements easy to implement as it guides users to install the correct optical components, and walks them through the appropriate alignments before measurements begin. Powerful analysis software includes access to the ICDD PDF2 database, allows for Rietveld whole pattern fitting, and 2D pattern analysis.

If you would like additional information about this tool, please email Carrie Donley (cdonley@email.unc.edu).

RTNN hosts XRD Symposium

Malvern PANalytical and the RTNN hosted a “Non-ambient X-ray Diffraction (XRD)” workshop at NC State November 8-9. The event brought together 48 attendees from 17 different universities and organizations to explore the research potential of non-ambient diffraction and practical advice for collecting accurate and useful data. On the evening of November 8, attendees learned more about on-going research during a poster session.

The picture shows Dr. Tom Blanton, the executive director of International Centre for Diffraction Data (ICDD), presenting his work on ‘Materials Characterization using the ICDD  PDF-4+’.