Malvern PANalytical and the RTNN hosted a “Non-ambient X-ray Diffraction (XRD)” workshop at NC State November 8-9. The event brought together 48 attendees from 17 different universities and organizations to explore the research potential of non-ambient diffraction and practical advice for collecting accurate and useful data. On the evening of November 8, attendees learned more about on-going research during a poster session.
The picture shows Dr. Tom Blanton, the executive director of International Centre for Diffraction Data (ICDD), presenting his work on ‘Materials Characterization using the ICDD PDF-4+’.
Non-ambient X-ray diffraction is a useful tool for determining phase stability, studying phase transformations, and following reaction pathways and kinetics. Practical examples include in-situ battery analysis for developing new cathode materials, understanding pharmaceutical stability with temperature and humidity, quantifying growth kinetics of nanocrystalline systems, and many more. New non-ambient chambers, faster instruments, and automatic data processing make non-ambient diffraction an ever-increasingly powerful technique. However, there are issues that can trip up the unwary, such as thermal gradients, unwanted reactions, systematic errors, etc. This symposium will feature lectures by leading researchers developing and using non-ambient diffraction on laboratory instruments, synchrotrons, and neutron beamlines. Lectures will focus on the research potential of non-ambient diffraction and practical advice for collecting accurate and useful data.
Attendees are encouraged to present a poster on their work related to this symposium. Speakers will judge the posters and prizes will be awarded to the top 3.
For more information and to register, please visit the event website.