Scanning Electron Microscopy Short Course

November 15, 2019 @ 9:00 am 5:00 pm

The goal for the day is to learn the basics of scanning electron microscopy (SEM) theory and SEM operation so that you can apply that knowledge to analyzing your own samples and/or understanding what SEM data means. Please note that a short course is designed to teach you how the technique works, the data that can be derived thereof, and what the generated data means. Training is designed to teach you the operational specifics of a particular instrument. Assuming that all is well you should be able to drive the Hitachi S-3200N SEM more or less independently by the end of the day. That said, it is not unusual for users to request additional training for a particular instrument.

We will start with an introduction lecture to SEM after which we will move to the lab. In the first lab, the student will observe a demonstration of SEM operation.  Then each of you will drive the microscope on a standard sample and we will explore changing instrument conditions and the resulting effect on the data. During this phase, we will also learn how to focus and correct astigmatism as well as how to properly set signal gain (contrast) and offset (brightness). After a break for lunch, there will be another lecture where we learn more about electron beam-sample interactions, detectors, how to pick imaging conditions, etc. Then we will go to the lab where you can apply what you have learned by imaging any sample you wish. You are welcome to bring a sample for this time or I can find one that is appropriate.

You should bring something to write with and on, a memory stick for the presentation and any data or other information that is electronic, and last but certainly not least, your brain. You can also bring a sample for hands-on time in the afternoon. We will take a short break for lunch, probably on the order of 30-45 minutes, so it might be smart to bring lunch with you.

This should be a relaxed and enjoyable day where you learn something fun and useful. Questions? Please contact Chuck Mooney at cbmooney@ncsu.edu. To maximize hands-on time, the class is limited to three students.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

Scanning Electron Microscopy Short Course

September 13, 2019 @ 9:00 am 5:00 pm

The goal for the day is to learn the basics of scanning electron microscopy (SEM) theory and SEM operation so that you can apply that knowledge to analyzing your own samples and/or understanding what SEM data means. Please note that a short course is designed to teach you how the technique works, the data that can be derived thereof, and what the generated data means. Training is designed to teach you the operational specifics of a particular instrument. Assuming that all is well you should be able to drive the Hitachi S-3200N SEM more or less independently by the end of the day. That said, it is not unusual for users to request additional training for a particular instrument.

We will start with an introduction lecture to SEM after which we will move to the lab. In the first lab, the student will observe a demonstration of SEM operation.  Then each of you will drive the microscope on a standard sample and we will explore changing instrument conditions and the resulting effect on the data. During this phase, we will also learn how to focus and correct astigmatism as well as how to properly set signal gain (contrast) and offset (brightness). After a break for lunch, there will be another lecture where we learn more about electron beam-sample interactions, detectors, how to pick imaging conditions, etc. Then we will go to the lab where you can apply what you have learned by imaging any sample you wish. You are welcome to bring a sample for this time or I can find one that is appropriate.

You should bring something to write with and on, a memory stick for the presentation and any data or other information that is electronic, and last but certainly not least, your brain. You can also bring a sample for hands-on time in the afternoon. We will take a short break for lunch, probably on the order of 30-45 minutes, so it might be smart to bring lunch with you.

This should be a relaxed and enjoyable day where you learn something fun and useful. Questions? Please contact Chuck Mooney at cbmooney@ncsu.edu. To maximize hands-on time, the class is limited to three students.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

Scanning Electron Microscopy Short Course

August 2, 2019 @ 9:00 am 5:00 pm

The goal for the day is to learn the basics of scanning electron microscopy (SEM) theory and SEM operation so that you can apply that knowledge to analyzing your own samples and/or understanding what SEM data means. Please note that a short course is designed to teach you how the technique works, the data that can be derived thereof, and what the generated data means. Training is designed to teach you the operational specifics of a particular instrument. Assuming that all is well you should be able to drive the Hitachi S-3200N SEM more or less independently by the end of the day. That said, it is not unusual for users to request additional training for a particular instrument.

We will start with an introduction lecture to SEM after which we will move to the lab. In the first lab, the student will observe a demonstration of SEM operation.  Then each of you will drive the microscope on a standard sample and we will explore changing instrument conditions and the resulting effect on the data. During this phase, we will also learn how to focus and correct astigmatism as well as how to properly set signal gain (contrast) and offset (brightness). After a break for lunch, there will be another lecture where we learn more about electron beam-sample interactions, detectors, how to pick imaging conditions, etc. Then we will go to the lab where you can apply what you have learned by imaging any sample you wish. You are welcome to bring a sample for this time or I can find one that is appropriate.

You should bring something to write with and on, a memory stick for the presentation and any data or other information that is electronic, and last but certainly not least, your brain. You can also bring a sample for hands-on time in the afternoon. We will take a short break for lunch, probably on the order of 30-45 minutes, so it might be smart to bring lunch with you.

This should be a relaxed and enjoyable day where you learn something fun and useful. Questions? Please contact Chuck Mooney at cbmooney@ncsu.edu. To maximize hands-on time, the class is limited to three students.

Registration costs: $50 for academic, government, and non-profit participants; $350 for industry participants

To register, add yourself to the short course through AIF’s lab management software, Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Analytical Instrumentation Facility (AIF)

aif.ncsu.edu

Monteith Research Center (Room 324), NC State University

2410 Campus Shore Drive
Raleigh, NC United States
+ Google Map

Explore the World through Microscopes

The RTNN will return to the Museum of Life and Science in Durham, NC on Saturday, August 17th from 10 am – 4 pm.

We will investigate things you encounter every day through a different lens! Join us as we take an up-close look at everything from bugs to Band-Aids through a Scanning Electron Microscope! Can you guess what you’re viewing from structures nanometers small?

Learn more about our previous event at the museum here.

Educators Showcase their Nano-Research

RTNN RET 2019 Poster Session
RET Participants share their summer research.

The RTNN hosted 11 educators this summer from Durham, Johnston, Wake, and Chatham Counties. The educators worked in small teams in research labs at NC State, Duke, and UNC as well as a start-up company, Smart Material Solutions. During their time in the program, educators were exposed to and participated in research in cutting-edge laboratories. They also had the opportunity to utilize multiple nanotechnology techniques and tools in RTNN facilities including atomic layer deposition, photolithography, scanning electron microscopy, and atomic force microscopy. Projects ranged from the creation and analysis of thin films to the development of new filter materials. Educators also wrote innovative lesson plans linked to their research to bring back to their home institutions. The program culminated in a poster session where teachers shared their summer work and how they will use their experiences in their classroom.

For more information about the RTNN’s RET Site, Atomic Scale Design and Engineering, visit the program website. Information and application instructions for next year’s program will be available in early 2020.